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Impact of Halo Doping on the Subthreshold Performance of Deep-Submicrometer CMOS Devices and Circuits for Ultralow Power Analog/Mixed-Signal Applications

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-30T09:07:30Z
dc.date.available 2023-10-30T09:07:30Z
dc.date.issued 2007-02
dc.identifier.uri https://ieeexplore.ieee.org/document/4067173
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12723
dc.description.abstract In addition to its attractiveness for ultralow power applications, analog CMOS circuits based on the subthreshold operation of the devices are known to have significantly higher gain as compared to their superthreshold counterpart. The effects of halo [both double-halo (DH) and single-halo or lateral asymmetric channel (LAC)] doping on the subthreshold analog performance of 100-nm CMOS devices are systematically investigated for the first time with extensive process and device simulations. In the subthreshold region, although the halo doping is found to improve the device performance parameters for analog applications (such as gm/Id, output resistance and intrinsic gain) in general, the improvement is significant in the LAC devices. Low angle of tilt of the halo implant is found to give the best improvement in both the LAC and DH devices. Our results show that the CMOS amplifiers made with the halo implanted devices have higher voltage gain over their conventional counterpart, and a more than 100% improvement in the voltage gain is observed when LAC doping is made on both the p- and n-channel devices of the amplifier. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject EEE en_US
dc.subject CMOS en_US
dc.subject Halo en_US
dc.subject Lateral asymmetric channel (LAC) en_US
dc.subject Subthreshold en_US
dc.subject Ultralow power en_US
dc.title Impact of Halo Doping on the Subthreshold Performance of Deep-Submicrometer CMOS Devices and Circuits for Ultralow Power Analog/Mixed-Signal Applications en_US
dc.type Article en_US


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