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Forward Body-biased Single Halo MOS Devices for Low Voltage Analog Circuits

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-11-04T06:48:22Z
dc.date.available 2023-11-04T06:48:22Z
dc.date.issued 2005
dc.identifier.uri https://ieeexplore.ieee.org/document/1562073
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12861
dc.description.abstract Forward body bias has been shown to be an effective way to improve the digital performance of CMOS circuits. However, as the technologies scale into the sub 100 nm regime, body bias sensitivity degrades, making the application of body bias less attractive for scaled CMOS technologies. In this work, we show for the first time that, Single Halo (SH) MOSFETS exhibit superior body bias sensitivity in the sub 100 nm regime compared to conventional technologies, which can be utilized for improving the performance of forward body-biased MOS devices such as dynamic threshold (DTMOS) and body-driven (BDMOS) transistors for low-voltage (LV) analog designs with the scaled technologies. Our result show that SH doping in these devices results in more than 50 % improvement of intrinsic gain and about a factor of two improvement in transconductance for DTMOS and BDMOS devices respectively, compared to their conventional counterparts. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject EEE en_US
dc.subject MOS devices en_US
dc.subject Low voltage en_US
dc.subject CMOS digital integrated circuits en_US
dc.title Forward Body-biased Single Halo MOS Devices for Low Voltage Analog Circuits en_US
dc.type Article en_US


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