Showing items related by title, author, creator and subject.

• Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices 

  Rao, V. Ramgopal (IEEE, 1998-05)

  In this paper, we describe the application of gate-induced-drain-leakage (GIDL) current for the characterization of gate edge damage which occurs during the plasma etch processes. We show from experimental and simulation ...
• Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs 

  Rao, V. Ramgopal (IEEE, 1998)

  The effect of plasma damage on the MOSFET's flicker noise properties is examined in this work. We observe an abnormal noise peak in the 1/f noise spectrum at around 2 kHz which is a characteristic of the plasma damage. The ...
• Cold atmospheric plasma therapy in wound healing 

  Pandey, Murali Monohar (Elsevier, 2022-01)

  Cold atmospheric plasma therapy is a new and latest approach whose arrival has astonished experts all around the world from the area of biological and pharmaceutical sciences. Owing to its simple and non-invasive nature, ...