| dc.contributor.author |
Sarkar, Niladri |
|
| dc.date.accessioned |
2024-02-20T10:28:54Z |
|
| dc.date.available |
2024-02-20T10:28:54Z |
|
| dc.date.issued |
2006-04 |
|
| dc.identifier.uri |
https://pubs.aip.org/aip/apl/article/88/16/162110/152605 |
|
| dc.identifier.uri |
http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14377 |
|
| dc.description.abstract |
Anomalous temperature dependence of resistivity at low temperature is observed in copper-phthallocyanine thin film. A model based on grain-boundary-controlled transport has been developed for the explanation of the observed anomaly. The prediction is based on the assumption that the thin film beyond a certain thickness is mainly polycrystalline, consisting of grains. The transport is expected to be limited by potential barriers at grain boundaries. |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
AIP |
en_US |
| dc.subject |
Physics |
en_US |
| dc.subject |
Transport properties |
en_US |
| dc.subject |
Electrical properties and parameters |
en_US |
| dc.subject |
Light emitting diodes |
en_US |
| dc.subject |
Crystallographic defects |
en_US |
| dc.subject |
Thin films |
en_US |
| dc.subject |
Potential energy barrier |
en_US |
| dc.title |
Grain-boundary-controlled current transport in copper phthalocyanine |
en_US |
| dc.type |
Article |
en_US |