| dc.contributor.author |
Nair, Sindhu S. |
|
| dc.date.accessioned |
2024-04-22T09:09:52Z |
|
| dc.date.available |
2024-04-22T09:09:52Z |
|
| dc.date.issued |
2004-09 |
|
| dc.identifier.uri |
https://www.sciencedirect.com/science/article/pii/S0039602804007496 |
|
| dc.identifier.uri |
http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/14608 |
|
| dc.description.abstract |
Using Auger electron spectroscopy we have studied the growth of cobalt oxide on Ag(1 0 0) substrate at different substrate temperatures (25, 170 and 250 °C). The films grown at 170 °C substrate temperature were found to grow closest to a layer-by-layer growth mode. In order to experimentally investigate the electronic structure of the CoO films angle-resolved UV photoelectron spectra were recorded for a 10 ML CoO film that are discussed and compared with available experimental results. |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Elsevier |
en_US |
| dc.subject |
Physics |
en_US |
| dc.subject |
Cobalt oxides |
en_US |
| dc.subject |
Angle resolved photoemission |
en_US |
| dc.subject |
Surface Electronic Phenomena |
en_US |
| dc.title |
Growth mechanism and angle-resolved photoemission spectra of cobalt oxide (CoO) thin films on Ag(1 0 0) |
en_US |
| dc.type |
Article |
en_US |