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Beyond SPICE Simulation: A Novel Variability-Aware STA Methodology for Digital Timing Closure

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dc.contributor.author Mishra, Neeraj
dc.date.accessioned 2025-01-08T04:31:38Z
dc.date.available 2025-01-08T04:31:38Z
dc.date.issued 2023-07
dc.identifier.uri https://ieeexplore.ieee.org/abstract/document/10192158
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/16738
dc.description.abstract This article proposes a method for performing device-level variability-aware static timing analysis (STA) on digital circuits using a tool flow methodology based on Python and Bash scripting. The method involves creating an effective current source model (ECSM) .libs file with a custom tool flow, which incorporates variation-aware timing models of standard cells to minimize recharacterization efforts. The resulting file is integrated into an industry-standard STA tool environment to assess the impact of device and layout level variability on digital timing closure. The simulation work is carried out using Mentor Graphics ELDO SPICE, Synopsys DC Compiler, and PrimeTime STA environment in STMicroelectronics (STM) 65 nm CMOS process. This tool flow reduces recharacterization efforts by 98.13% compared to conventional SPICE simulation by incorporating the impact of device-level variability on the conventional STA flow. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject EEE en_US
dc.subject Effective current source model (ECSM) en_US
dc.subject Python plotting tool en_US
dc.subject Variability-aware STA en_US
dc.subject Semiconductor device modeling en_US
dc.title Beyond SPICE Simulation: A Novel Variability-Aware STA Methodology for Digital Timing Closure en_US
dc.type Article en_US


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