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Part II: A Fully Integrated RF PA in 28-nm CMOS With Device Design for Optimized Performance and ESD Robustness
Rao, V. Ramgopal
(
IEEE
,
2015-10
)
A Fully Integrated RF PA in 28nm CMOS with Device Design for Optimized Performance and ESD Robustness
Rao, V. Ramgopal
(
IEEE
,
2015-09
)
High-Voltage MOS Device Design for Improved Static and RF Performance
Rao, V. Ramgopal
(
IEEE
,
2015-10
)
Negative differential conductivity and carrier heating in gate-all-around Si nanowire FETs and its impact on CMOS logic circuits
Rao, V. Ramgopal
(
IOP
,
2014-02
)
A novel architecture for improving slew rate in FinFET-based op-amps and OTAs
Rao, V. Ramgopal
(
Elsevier
,
2011-05
)
CMOS Logic Device and Circuit Performance of Si Gate All Around Nanowire MOSFET
Rao, V. Ramgopal
(
IEEE
,
2014-09
)
Random Dopant Fluctuation Induced Variability in Undoped Channel Si Gate all Around Nanowire n-MOSFET
Rao, V. Ramgopal
(
IEEE
,
2015-02
)
Optimization of sub 100 nm Γ-gate Si-MOSFETs for RF applications
Rao, V. Ramgopal
(
2005-04
)
Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies
Rao, V. Ramgopal
(
Elsevier
,
2003-04
)
Ultra-thin silicon nitride by hot wire chemical vapor deposition (HWCVD) for deep sub-micron CMOS technologies
Rao, V. Ramgopal
(
Elsevier
,
2002-07
)
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Author
Rao, V. Ramgopal (12)
Subject
CMOS technologies (12)
EEE (12)
Device-circuit codesign (2)
Electrostatic discharge (ESD) (2)
Shallow-trench-isolation (STI) (2)
System-on-chip (SoC) (2)
Characteristic fluctuations (1)
Circuit delays (1)
Circuits (1)
DePMOS Device (1)
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Date Issued
2010 - 2015 (7)
2000 - 2009 (5)
Has File(s)
No (12)