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Now showing items 1-10 of 13

Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing

Rao, V. Ramgopal (IEEE, 2003-08)
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs

Rao, V. Ramgopal (IEEE, 2003)
The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance

Rao, V. Ramgopal (IEEE, 2001-09)
Study of Degradation in Channel Initiated Secondary Electron Injection Regime

Rao, V. Ramgopal (IEEE, 2001-09)
High-field stressing of LPCVD gate oxides

Rao, V. Ramgopal (IEEE, 1997-03)
A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs]

Rao, V. Ramgopal (IEEE, 2005)
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories

Rao, V. Ramgopal (IEEE, 2004-07)
Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs

Rao, V. Ramgopal (IEEE, 2004-07)
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs

Rao, V. Ramgopal (IEEE, 2002-07)
Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability

Rao, V. Ramgopal (IEEE, 2002-09)

Now showing items 1-10 of 13