Search

Filters

Use filters to refine the search results.

Current Filters:




New Filters:

Showing 7 out of a total of 7 results for community: BITS Faculty Publications. (0.008 seconds)

Now showing items 1-7 of 7

1

Sort Options:
Results Per Page:
- 5
- 10
- 20
- 40
- 60
- 80
- 100

Part II: A Fully Integrated RF PA in 28-nm CMOS With Device Design for Optimized Performance and ESD Robustness

Rao, V. Ramgopal (IEEE, 2015-10)
A Fully Integrated RF PA in 28nm CMOS with Device Design for Optimized Performance and ESD Robustness

Rao, V. Ramgopal (IEEE, 2015-09)
Physical Insight Toward Heat Transport and an Improved Electrothermal Modeling Framework for FinFET Architectures

Rao, V. Ramgopal (IEEE, 2012-05)
Comparison of breakdown characteristics of DeNMOS devices with various drain structures

Rao, V. Ramgopal (IEEE, 2015-10)
On the thermal failure in nanoscale devices: Insight towards heat transport including critical BEOL and design guidelines for robust thermal management & EOS/ESD reliability

Rao, V. Ramgopal (IEEE, 2011)
On the Transient behavior of various drain extended MOS devices under the ESD stress condition

Rao, V. Ramgopal (IEEE, 2010)
3D TCAD based approach for the evaluation of nanoscale devices during ESD failure

Rao, V. Ramgopal (IEEE, 2010-11)

Now showing items 1-7 of 7

1

Sort Options:
Results Per Page:
- 5
- 10
- 20
- 40
- 60
- 80
- 100

Browse

All of DSpace
This Community
- By Issue Date
- Authors
- Titles
- Subjects

My Account

Discover

Author
- Rao, V. Ramgopal (7)
Subject
- EEE (7)
- Electrostatic discharge (ESD) (7)
- Shallow-trench-isolation (STI) (3)
- BEOL reliability (2)
- CMOS technologies (2)
- Device-circuit codesign (2)
- System-on-chip (SoC) (2)
- Base push-out (1)
- Current filamentation (1)
- Drain Extended MOS (1)
- ... View More
Date Issued
- 2015 (3)
- 2010 (2)
- 2011 (1)
- 2012 (1)
Has File(s)
- No (7)