Search

Filters

Use filters to refine the search results.

Current Filters:




New Filters:

Showing 4 out of a total of 4 results for community: BITS Faculty Publications. (0.006 seconds)

Now showing items 1-4 of 4

1

Sort Options:
Results Per Page:
- 5
- 10
- 20
- 40
- 60
- 80
- 100

Study of Degradation in Channel Initiated Secondary Electron Injection Regime

Rao, V. Ramgopal (IEEE, 2001-09)
Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs

Rao, V. Ramgopal (IEEE, 2001-04)
A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique

Rao, V. Ramgopal (Elsevier, 2001-10)
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping

Rao, V. Ramgopal (Elsevier, 1999-09)

Now showing items 1-4 of 4

1

Sort Options:
Results Per Page:
- 5
- 10
- 20
- 40
- 60
- 80
- 100

Browse

All of DSpace
This Community
- By Issue Date
- Authors
- Titles
- Subjects

My Account

Discover

Author
- Rao, V. Ramgopal (4)
Subject
- Charge pumping (4)
- EEE (4)
- MOSFETs (4)
- Current measurement (1)
- Degradation (1)
- Hot carriers (1)
- Hot-carrier effect (1)
- Jet vapor deposition (JVD) (1)
- Nonvolatile memory (1)
- Silicon nitride (1)
- ... View More
Date Issued
- 2001 (3)
- 1999 (1)
Has File(s)
- No (4)