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Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing

Rao, V. Ramgopal (IEEE, 2003-08)
Study of Degradation in Channel Initiated Secondary Electron Injection Regime

Rao, V. Ramgopal (IEEE, 2001-09)
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs

Rao, V. Ramgopal (IEEE, 2002-07)
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric

Rao, V. Ramgopal (IEEE, 1999)
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics

Rao, V. Ramgopal (IEEE, 1999-09)

Now showing items 1-5 of 5