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Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
(
IEEE
,
2003
)
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
(
The Japan Society of Applied Physics
,
2001
)
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
(
IEEE
,
2001-09
)
Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs
Rao, V. Ramgopal
(
IEEE
,
1997-12
)
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs
Rao, V. Ramgopal
(
IEEE
,
2002-06
)
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
(
IEEE
,
1999
)
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
(
IEEE
,
2000
)
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Author
Rao, V. Ramgopal (7)
Subject
EEE (7)
Hot carriers (7)
MOSFETs (7)
Degradation (2)
Transconductance (2)
Charge pumping (1)
CMOS technology (1)
Current measurement (1)
Doping profiles (1)
Fabrication (1)
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Date Issued
2001 (2)
1997 (1)
1999 (1)
2000 (1)
2002 (1)
2003 (1)
Has File(s)
No (7)