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Degradation Study of Ultra-Thin JVD Silicon Nitride MNSFET
Rao, V. Ramgopal
(
Springer
,
2011-02
)
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Author
Rao, V. Ramgopal (181)
Subject
EEE (181)
Microcantilevers (14)
Organic field effect transistors (OFETs) (12)
Sensors (11)
MEMS (9)
CMOS technologies (7)
Electrostatic discharge (ESD) (7)
Self-assembled monolayer (SAM) (7)
Drain-extended MOSFET (DeMOS) (6)
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