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Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs
Rao, V. Ramgopal
(
IEEE
,
2000-04
)
The impact of high-/spl kappa/ gate dielectrics and metal gate electrodes on sub-100 nm MOSFETs
Rao, V. Ramgopal
(
IEEE
,
1999-07
)
The Effects of Varying Tilt Angle of Halo Implant on the Performance of Sub 100nm LAC MOSFETs
Rao, V. Ramgopal
(
IEEE
,
2006-08
)
Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
(
IEEE
,
2003
)
Effective dielectric thickness Scaling for High-K Gate Dielectric MOSFETs
Rao, V. Ramgopal
(
Springer
,
2011
)
Detailed analysis of FIBL in MOS transistors with high-k gate dielectrics
Rao, V. Ramgopal
(
IEEE
,
2003-01
)
Application of look-up table approach to high-K gate dielectric MOS transistor circuits
Rao, V. Ramgopal
(
IEEE
,
2003-01
)
Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs
Rao, V. Ramgopal
(
Springer
,
2001
)
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
(
The Japan Society of Applied Physics
,
2001
)
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
(
IEEE
,
2001
)
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Author
Rao, V. Ramgopal (50)
Bhatt, Upendra Mohan (1)
Gupta, Navneet (1)
Kandpal, Kavindra (1)
Mourya, Satyendra Kumar (1)
Singh, Dheerendra (1)
Subject
EEE (52)
MOSFETs (52)
Hot carriers (7)
Los Angeles Council (7)
Degradation (5)
Charge pumping (4)
Capacitance (3)
Circuit simulation (3)
Current measurement (3)
FinFETs (3)
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2020 - 2024 (1)
2010 - 2019 (3)
2000 - 2009 (37)
1997 - 1999 (11)
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No (52)