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Browsing Department of Electrical and Electronics Engineering by Subject "22nm design"

Browsing Department of Electrical and Electronics Engineering by Subject "22nm design"

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  • Rao, V. Ramgopal (IEEE, 2012)
    With every new technology node, scaling down of Device-to-Interconnect Capacitance ratio causes Interconnect delay to become bottleneck for circuit performance. To miti-gate this effect, interconnect routing area on-chip ...

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