The data available for training, testing and validation of a neural network defines the efficiency or performance of the network. This research work compares the data division techniques like random division, Self-Organizing ...

This paper demonstrates a mechanism of modeling the performance of inverters using performance data along with climatological parameters. integrating PV generation data at inverter level from different generation sources ...

A sinusoidal PWM inverter is required to faithfully reproduce the control waveforms at the output with minimum distortion. This paper presents some design considerations for such an inverter. The choice of switching frequency ...

This paper introduces an irradiance loss factor that quantifies the relationship between irradiance, tilt angle and power output of a soiled panel with the soil particle size composition. Artificial soiling experiments ...

The performance of a neural network model depends on the data used to develop the model and nature of data preprocessing used in its training algorithm. This paper proposes a hybrid clustering algorithm to preprocess the ...

A non-intrusive mechanism of gathering real-time performance of inverter data is explained. Network architecture was designed to get this data from various inverters in an area of 200 acres with synchronised time interval ...

Modern PV arrays are generally designed with bypass diodes to avoid damage. However, such arrays exhibit multiple peaks in their P–V characteristics under partial shading conditions. Owing to the limitation in the abilities ...

This paper proposes modifications to Incremental Conductance (INC) concept to track global maximum power point under partial shading conditions of photovoltaic (PV) systems. The proposed algorithm determines the p-v curve ...

This work proposes a soft-switched quadratic quadrupler boost converter with high voltage step up gain and low voltage stress on devices. With this converter topology, high voltage gain is achieved at low duty ratio operation ...

Negative Bias Temperature Instability (NBTI) is identified as one of the most critical reliability concerns for nanometer scale digital VLSI integrated circuits. Degradation occurring in threshold voltages of PMOS device ...