| dc.contributor.author |
Gupta, Anu |
|
| dc.contributor.author |
Chaturvedi, Nitin |
|
| dc.date.accessioned |
2025-08-29T07:00:57Z |
|
| dc.date.available |
2025-08-29T07:00:57Z |
|
| dc.date.issued |
2025 |
|
| dc.identifier.uri |
https://link.springer.com/book/10.1007/978-981-97-3756-7 |
|
| dc.identifier.uri |
http://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/19264 |
|
| dc.description.abstract |
This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Springer |
en_US |
| dc.subject |
EEE |
en_US |
| dc.subject |
VLSI testing |
en_US |
| dc.subject |
VLSI design |
en_US |
| dc.subject |
Low-power integrated circuits |
en_US |
| dc.subject |
FPGA-based design |
en_US |
| dc.subject |
Embedded systems |
en_US |
| dc.subject |
Memory design |
en_US |
| dc.title |
VLSI for embedded intelligence: |
en_US |
| dc.title.alternative |
Proceedings of the 27th International Symposium, VDAT 2023 |
en_US |
| dc.type |
Book |
en_US |