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Browsing Department of Computer Science and Information Systems by Subject "Variation-aware Analog Yield"

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Parameter-importance based Monte-Carlo technique for variation-aware analog yield optimization

Naidu, S.R. (IEEE, 2016)

The Monte-Carlo method is the method of choice for accurate yield estimation. Standard Monte-Carlo methods suffer from a huge computational burden even though they are very accurate. Recently a Monte-Carlo method was ...

Now showing items 1-1 of 1

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