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Characterization of Logical Effort for Improved Delay

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dc.contributor.author Gupta, Anu
dc.date.accessioned 2023-02-10T09:51:31Z
dc.date.available 2023-02-10T09:51:31Z
dc.date.issued 2013
dc.identifier.uri https://link.springer.com/chapter/10.1007/978-3-642-42024-5_14
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9149
dc.description.abstract In this paper, an effort has been made to improve the delay of a gate by skewing the gates by choosing proper sizing. The expression for skewed logical effort has been derived for universal logic gates namely NOT, NAND and NOR for minimizing the delay. The validations for minimum delay through simulation was done on a chain of inverters. The improved skewed gates showed 10% - 20% delay reduction on a chain of inverters as compared with normal skewed gate, high and low skewed gates, whereas, an improvement of 20% - 25% when compared to skewed gates favoring a particular transition. All simulations are done using Spectre in Cadence environment in UMC90nm CMOS technology at 1V power supply. en_US
dc.language.iso en en_US
dc.publisher Springer en_US
dc.subject EEE en_US
dc.subject Characterization en_US
dc.subject CMOS technology en_US
dc.subject Delay en_US
dc.subject Logical effort en_US
dc.subject Skewed gate en_US
dc.title Characterization of Logical Effort for Improved Delay en_US
dc.type Article en_US


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