The Effects of Varying Tilt Angle of Halo Implant on the Performance of Sub 100nm LAC MOSFETs

dc.contributor.authorRao, V. Ramgopal
dc.date.accessioned2023-11-04T04:08:47Z
dc.date.available2023-11-04T04:08:47Z
dc.date.issued2006-08
dc.description.abstractIn this paper we systematically investigate the effects of the varying tilt angle of the halo implants on the different device performance parameters of 100 nm lateral asymmetric channel (LAC) MOSFETs. The tilt angle is varied from 5deg to 60deg with twist angle 0deg. Substantial reduction of sub-threshold swing is found for large tilt angles as compared to low angles of halo implant. The device structure, known as lateral asymmetric channel with large angle tilt implant (LACLATI), exhibits better reverse short channel effect and I on /I off , and lower junction capacitanceen_US
dc.identifier.urihttps://ieeexplore.ieee.org/document/4216567
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12857
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectImplantsen_US
dc.subjectLos Angeles Councilen_US
dc.subjectMOSFETsen_US
dc.subjectThreshold voltageen_US
dc.subjectElectronics industryen_US
dc.subjectInformation Systemsen_US
dc.subjectCommunication industryen_US
dc.titleThe Effects of Varying Tilt Angle of Halo Implant on the Performance of Sub 100nm LAC MOSFETsen_US
dc.typeArticleen_US

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