Improved Implementation of CRL and SCRL Gates for Ultra Low Power

dc.contributor.authorGupta, Anu
dc.date.accessioned2023-02-10T04:30:38Z
dc.date.available2023-02-10T04:30:38Z
dc.date.issued2009
dc.description.abstractWorking with low frequency universal charge recovery logic (CRL) based NAND gate, the leakage current results in gradual charge up of the output node resulting in an incorrect output. A better implementation of the same circuit which increases the output resistance for the leakage current is used to mitigate this drawback in this paper. Also an analysis of the effect of rise time of clock edge on power dissipation of the split charge recovery logic (SCRL) based NAND gates has also been done.en_US
dc.identifier.urihttps://ieeexplore.ieee.org/document/5328051
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9136
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectEEEen_US
dc.subjectLeakage currenten_US
dc.subjectCircuitsen_US
dc.subjectFrequencyen_US
dc.subjectRailsen_US
dc.subjectLogicen_US
dc.subjectPower engineering and energyen_US
dc.titleImproved Implementation of CRL and SCRL Gates for Ultra Low Poweren_US
dc.typeArticleen_US

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