Negative Ion Mass Spectrometry: Part 2?—Ionization Processes in 2- and 3-Nitrotoluene

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dc.contributor.authorAlexander, Roger G.
dc.contributor.authorBigley, David B.
dc.contributor.authorTurner, Robert B.
dc.contributor.authorTodd, John F. J.
dc.date.accessioned2025-06-25T05:29:13Z
dc.date.available2025-06-25T05:29:13Z
dc.date.issued1974
dc.description.abstractIonization efficiency curves (profiles) have been recorded for parent and major daughter negative ions from 2- and 3-nitrotoluene. From the effects of adding sulphur hexafluoride as a thermal electron scavenger it is concluded that slow electron capture is a major process in the formation of both parent and fragmentation product ions. The conditions obtaining within a negative ion source operating with 70 eV electrons are discussed.en_US
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/jspui/handle/123456789/18996
dc.language.isoenen_US
dc.publisherJournal of the Chemical Society : Faraday Transaction - I. The Chemical Society, London. 1974, 70 (07)en_US
dc.subjectChemistryen_US
dc.subjectNegative Ion Mass Spectrometryen_US
dc.subjectIonization Processesen_US
dc.subjectJournal of the Chemical Society : Faraday Transaction - Ien_US
dc.titleNegative Ion Mass Spectrometry: Part 2?—Ionization Processes in 2- and 3-Nitrotolueneen_US
dc.typeArticleen_US

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