Optimization of sub 100 nm Γ-gate Si-MOSFETs for RF applications

dc.contributor.authorRao, V. Ramgopal
dc.date.accessioned2023-10-30T09:20:53Z
dc.date.available2023-10-30T09:20:53Z
dc.date.issued2005-04
dc.description.abstractThis paper presents characterization and simulation studies on the RF performance of the Γ (Gamma) gate MOSFETs. The Γ-gate MOSFET offers the advantage of reduced gate resistance, a critical parameter in high frequency circuits. The aim of this study is to identify the optimum Γ-gate extension length from the gate and drain resistance point of view in aggressively scaled CMOS.en_US
dc.identifier.urihttp://repository.ias.ac.in/79790/
dc.identifier.urihttp://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12725
dc.language.isoenen_US
dc.subjectEEEen_US
dc.subjectMOSFETsen_US
dc.subjectCMOS technologiesen_US
dc.titleOptimization of sub 100 nm Γ-gate Si-MOSFETs for RF applicationsen_US
dc.typeArticleen_US

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