Grain-boundary-controlled current transport in copper phthalocyanine
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Date
2006-04
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Publisher
AIP
Abstract
Anomalous temperature dependence of resistivity at low temperature is observed in copper-phthallocyanine thin film. A model based on grain-boundary-controlled transport has been developed for the explanation of the observed anomaly. The prediction is based on the assumption that the thin film beyond a certain thickness is mainly polycrystalline, consisting of grains. The transport is expected to be limited by potential barriers at grain boundaries.
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Keywords
Physics, Transport properties, Electrical properties and parameters, Light emitting diodes, Crystallographic defects, Thin films, Potential energy barrier