Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs
| dc.contributor.author | Rao, V. Ramgopal | |
| dc.date.accessioned | 2023-11-07T06:36:09Z | |
| dc.date.available | 2023-11-07T06:36:09Z | |
| dc.date.issued | 2001-10 | |
| dc.description.abstract | This paper presents results on the characterization of Lateral Asymmetric Channel (LAC) thin film silicon-on-insulator (SOI) MOSFETs. These devices are compared with conventional SOI MOSFETs having uniform channel doping. The measurements have been taken for a number of channel lengths, silicon film thicknesses, and tilt angles of implantation. The aspects studied include threshold voltage roll-off, kink effect, gate induced drain leakage (GIDL) and parasitic bipolar transistor action. Measurements have been supplemented by device simulations. The LAC devices show excellent characteristics, with many advantages over the conventional devices. | en_US |
| dc.identifier.uri | https://ieeexplore.ieee.org/document/981564 | |
| dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12888 | |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.subject | EEE | en_US |
| dc.subject | Los Angeles Council | en_US |
| dc.subject | Semiconductor films | en_US |
| dc.subject | Threshold voltage | en_US |
| dc.subject | Length measurement | en_US |
| dc.subject | Thickness measurement | en_US |
| dc.title | Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs | en_US |
| dc.type | Article | en_US |
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